Inauguration of the Advanced Device and Materials Testing Laboratory
DOST Compound, Bicutan, Taguig City
31 May 2013
President Benigno S. Aquino III expressed his confidence that the country’s first Advanced Device and Materials Testing Laboratory (ADMATEL) will boost the country’s semiconductor industry to global heights during its inauguration at the Department of Science and Technology’s (DOST) compound in Bicutan, Taguig City.
“Without doubt, this facility will pull our semiconductors industry up the value chain, and move them closer to their target of becoming a fifty billion dollar industry by 2016. To fast track this growth, we need to become the country that not only has the capacity to build semiconductors –and build them well at that – but that which has the capacity to design, and test them here,” he said.
President Aquino also assured members and shareholders of the semiconductors industry that the government is keen to improve and enhance the country’s electronic market. Adding that on top of the newly inaugurated ADMATEL laboratory, the DOST will open the Philippines Product Development Center next year and the Philippine Microelectronics Center later this year.
The President also announced that he had increased DOST’s budget from PhP 5.2 billion in 2010 to PhP 9.9 billion in 2013 as a result of the 7.8 percent economic growth recorded in the first quarter of 2013.
With a testing laboratory made readily accessible, testing costs of local companies will relatively go down and turnaround time is reduced from one month to four days for sample testing which previously had to be shipped out to neighboring countries.
ADMATEL houses the following highly specialized equipment designed for failure analysis and advanced materials characterization which will be vital in spotting defects and to ensure quality control of electronic device components before it reach consumers: Focus Ion Beam-Field Emission Scanning Electron Microscope (FIB-FESEM), Scanning Electronic Microscope with Energy Dispersive X-ray (SEM-EDX), Time of Flight Secondary Ion Mass Spectroscopy (TOFSIMS) and Auger Electron Spectroscopy (AES).